Takeshi Yamagishi

Real-time, interferometrically measuring atomic force microscope for direct calibration of standards

Satoshi Gonda, Takuma Doi, Tomizo Kurosawa et al. · Review of Scientific Instruments · 1999 · 110 citations

Natural Sciences, Physics, Instrumentation +16

Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales

Ichiko Misumi, Satoshi Gonda, Qiangxian Huang et al. · Measurement Science and Technology · 2005 · 67 citations

Engineering, Materials Engineering, Materials Science +17

Thickness measurement of a thin-film layer on an anisotropic substrate by phase-sensitive acoustic microscope

Yasuo Sasaki, Tomio Endo, Takeshi Yamagishi et al. · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 1992 · 33 citations

Natural Sciences, Materials Science, Physics +16

Accurate topographic images using a measuring atomic force microscope

Satoshi Gonda, Takuma Doi, Tomizo Kurosawa et al. · Applied Surface Science · 1999 · 29 citations

Natural Sciences, Materials Science, Physics +14

Determination of Sound Velocities by High Frequency Complex V(z) Measurement in Acoustic Microscopy

Tomio Endo, Yasuo Sasaki, Takeshi Yamagishi et al. · Japanese Journal of Applied Physics · 1992 · 15 citations · Full text

Natural Sciences, Materials Science, Physics +15