Je-Hyoung Park

Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices

Amirkoushyar Ziabari, Je-Hyoung Park, Ehsan K. Ardestani et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2014 · 73 citations

Engineering, Vlsi Design, Power Devices +26

Method of images for the fast calculation of temperature distributions in packaged VLSI chips

Virginia Martin Heriz, Je-Hyoung Park, Travis Kemper et al. · 2007 · 26 citations · Full text

Engineering, Vlsi Design, Computer Architecture +22

Fast Thermal Analysis of Vertically Integrated Circuits (3-D ICs) Using Power Blurring Method

Je-Hyoung Park, Ali Shakouri, Sung‐Mo Kang · 2009 · 19 citations

Engineering, Vlsi Design, Energy Efficiency +21

Fast Evaluation Method for Transient Hot Spots in VLSI ICs in Packages

Je-Hyoung Park, Ali Shakouri, Sung‐Mo Kang · 2008 · 12 citations

Engineering, Vlsi Design, Computer Architecture +22

Fast Computation of Temperature Profiles of VLSI ICs with High Spatial Resolution

Je-Hyoung Park, Xi Wang, Ali Shakouri et al. · 2008 · 12 citations

Engineering, Vlsi Design, Computer Architecture +25