Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

C. Martinella, Thomas Ziemann, Roger Stark, +5

IEEE Transactions on Nuclear Science

Electrical EngineeringPower MosfetEngineeringHeavy-ion MicrobeamsPhysics +12

Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs

C. Martinella, Roger Stark, Thomas Ziemann, +3

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringHigh SensitivityPower DeviceNanoelectronics +9

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

C. Martinella, Rubén García Alía, Roger Stark, +6

IEEE Transactions on Nuclear Science

ReliabilityElectrical EngineeringEngineeringPower DeviceBias Temperature Instability +10

Accuracy of Three Interterminal Capacitance Models for SiC Power MOSFETs Under Fast Switching

Roger Stark, Alexander Tsibizov, Neha Nain, +1

IEEE Transactions on Power Electronics

Device ModelingElectrical EngineeringPower MosfetEngineeringSemiconductor Device +12

Peripheral blood T cell activation after radioiodine treatment for Graves' disease

Weiping Teng, Roger Stark, AlistairJ. Munro, +3

European Journal of Endocrinology

Parasitic Extraction Procedures for SiC Power Modules

Ivana Kovacevic-Badstuebner, Roger Stark, Mattia Guacci, +1

Repository for Publications and Research Data (ETH Zurich)

Device ModelingAnsys Q3d ExtractorElectrical EngineeringSemiconductor DeviceEngineering +10

A converter control field bus protocol for power electronic systems with a synchronization accuracy of ±5ns

Christoph Carstensen, R. E. Christen, Hannes Vollenweider, +2

EngineeringPower Electronics ConverterComputer ArchitectureSystem-level DesignPower Electronic Systems +16

Gate Capacitance Characterization of Silicon Carbide and Silicon Power mosfets Revisited

Roger Stark, Alexander Tsibizov, Ivana Kovacevic-Badstuebner, +1

IEEE Transactions on Power Electronics

High-Energy Proton and Atmospheric-Neutron Irradiations of SiC Power MOSFETs: SEB Study and Impact on Channel and Drift Resistances

C. Martinella, Salvatore Race, Roger Stark, +2

IEEE Transactions on Nuclear Science

EngineeringSic Power MosfetsPower ElectronicsHigh Voltage EngineeringPlanar Gate +18

Short Circuit Ruggedness of New Generation 1.2 kV SiC MOSFETs

Bhagyalakshmi Kakarla, Thomas Ziemann, Roger Stark, +1

EngineeringSilicon CarbidePower ElectronicsKv Sic MosfetSemiconductor Device +14