Takeshi Uruma

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Active since

2016

Affiliations

Takeshi Uruma is an author at Chiba Institute of Technology specializing in electrical characterization, semiconductor devices, and semiconductor materials.

ORCID

Publications per year

2016–2017

Publications

Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto · Japanese Journal of Applied Physics · 2016 · 20 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto · Japanese Journal of Applied Physics · 2017 · 12 citations

Natural Sciences, Electrical Engineering, Physics +17

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