Statistics
Publications
1
Citations
10
H-Index
1
Active since
2003
Affiliations
NEC (Japan)(Current)
Y. Aimoto is an author at NEC (Japan) specializing in memory test, memory circuits, and memory built-in self-repair.
Publications per year
2003–2003
1
1
A 30 ns 64 Mb DRAM with built-in self-test and repair function
H. Koike, Akimitsu TANABE, T. Takeshima et al. · 2003 · 10 citations
Engineering, Computer Engineering, Electrical Engineering +15
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