1
Publications
129
Citations
1
H-Index
2016
Active since
Affiliations
Tan Ah Hwee is an author at National Institute of Advanced Industrial Science and Technology specializing in pattern recognition, computer vision, and reflectance.
Top concepts
ReflectionEngineeringReflectanceDeep LearningImage AnalysisMachine VisionScene AnalysisComputer VisionInverse ProblemsBiomedical Imaging
Publications per year
2016–2016
1
1
Depth of field guided reflection removal
Renjie Wan, Boxin Shi, Tan Ah Hwee et al. · 2016 · 129 citations
Dof Map, Scene Analysis, Engineering +18
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