Concepedia

M. Ushiyama

MU

Statistics

Publications

2

Citations

96

H-Index

2

Active since

2002

Affiliations

Hitachi (Japan)(Current)

M. Ushiyama is an author at Hitachi (Japan) specializing in applied physics, engineering, and physics.

Top concepts

Publications per year

2002–2002

2

Publications

2

Read-disturb degradation mechanism due to electron trapping in the tunnel oxide for low-voltage flash memories

Masataka Kato, Naoki Miyamoto, Haruki Kume et al. · 2002 · 81 citations

, , +18

Two dimensionally inhomogeneous structure at gate electrode/gate insulator interface causing Fowler-Nordheim current deviation in nonvolatile memory

M. Ushiyama, Yuzuru Ohji, T. Nishimoto et al. · 2002 · 15 citations

, , +23

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