Kenneth J. Radigan

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Active since

1995

Affiliations

Texas Instruments (United States)(Current)

Kenneth J. Radigan is an author at Texas Instruments (United States) specializing in silicon wafers, manufacturing engineering, and inorganic spectroscopy.

Publications per year

1995–2002

Publications

Quantitative analysis of borophosphosilicate glass films on silicon using infrared external reflection–absorption spectroscopy

James E. Franke, Lizhong Zhang, Thomas M. Niemczyk et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1995 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +15

Using full wafer defect maps as process signatures to monitor and control yield

Kenneth J. Radigan, Brian Sheumaker, Nathan H. Heller · 2002 · 11 citations

Engineering, Manufacturing Engineering, Computer-integrated Manufacturing +16

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