Eika Tsunemi

Multi-Probe Atomic Force Microscopy Using Piezoelectric Cantilevers

Nobuo Satoh, Eika Tsunemi, Yuji Miyato et al. · Japanese Journal of Applied Physics · 2007 · 24 citations

Engineering, Microscopy, Mechanical Engineering +17

Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams

Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige et al. · Review of Scientific Instruments · 2011 · 22 citations

Optical Materials, Engineering, Microscopy +24

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

Eika Tsunemi, Nobuo Satoh, Yuji Miyato et al. · Japanese Journal of Applied Physics · 2007 · 19 citations

Afm Cantilevers, Engineering, Biomedical Diagnostics +13

Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy

Masaharu Hirose, Eika Tsunemi, Kei Kobayashi et al. · Applied Physics Letters · 2013 · 17 citations

Engineering, Microscopy, Organic Electronics +20

Fabrication and Characterization of Floating Memory Devices Based on Thiolate-Protected Gold Nanoclusters

Naoyuki Hirata, Minako Sato, Eika Tsunemi et al. · The Journal of Physical Chemistry C · 2016 · 16 citations

Engineering, Nanocluster, Metal Nanoparticles +17