2
Publications
226
Citations
2
H-Index
2006
Active since
M. Siegbahn is an author at Nokia (Finland) specializing in treatment verification, instrumentation, and measurement.
Top concepts
RadarEducationRadiologyStatisticsCalibrationEngineeringMeasurementData ScienceBiostatisticsInstrumentation
Publications per year
2006–2010
2
2
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1–2 of 2