Jari Hyyryläinen is an author at Nokia (Finland) specializing in calibration, measurement, and electromagnetic compatibility.
Top concepts
EducationCalibrationEngineeringMeasurementInstrumentationMicroelectronicsElectrical InsulationElectrical EngineeringElectromagnetic Compatibility
Publications per year
2004–2004
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Transient capacitance measurement of MEM capacitor
H. Nieminen, Jari Hyyryläinen, Timo Veijola et al. · Sensors and Actuators A Physical · 2004 · 17 citations
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