J. O. Kim

Elastic constants of single-crystal transition-metal nitride films measured by line-focus acoustic microscopy

J. O. Kim, J. D. Achenbach, Paul B. Mirkarimi et al. · Journal of Applied Physics · 1992 · 338 citations · Full text

Natural Sciences, Materials Science, Physics +17

A combined finite element method/boundary element method technique for <i>V</i>(<i>z</i>) curves of anisotropic-layer/substrate configurations

G. R. Liu, J. D. Achenbach, J. O. Kim et al. · The Journal of the Acoustical Society of America · 1992 · 35 citations

Natural Sciences, Computational Engineering, Acoustics +16

Effect of surface discontinuities on V(z) and V(z, x) for the line-focus acoustic microscope

Zheng-Yang Li, J. D. Achenbach, J. O. Kim · Wave Motion · 1991 · 17 citations

Natural Sciences, Physics, Acoustics +8

Numerical modeling of the V(z) curve for a thin-layer/substrate configuration

V. S. Ahn, J. D. Achenbach, Zheng-Yang Li et al. · Research in Nondestructive Evaluation · 1991 · 10 citations

Natural Sciences, Computational Engineering, Acoustics +14