K. Piplits

Optical Er-doping of Si during sublimational molecular beam epitaxy

B. A. Andreev, Andrei Andreev, H. Ellmer et al. · Journal of Crystal Growth · 1999 · 26 citations

Optical Materials, Engineering, Optical Properties +6

Quantitative investigation of boron incorporation in polycrystalline CVD diamond films by SIMS

Thomas Kolber, K. Piplits, Roland Haubner et al. · Fresenius Journal of Analytical Chemistry · 1999 · 19 citations

Materials Science, Materials Engineering, Diamond-like Carbon +7

Range evaluation in SIMS depth profiles of Er-implantations in silicon

Karl Mayerhofer, H. Foisner, K. Piplits et al. · Applied Surface Science · 2005 · 13 citations

Electrical Engineering, Engineering, Applied Physics +6

Investigations of corrosion phenomena on gold coins with SIMS

Karl Mayerhofer, K. Piplits, R. Traum et al. · Applied Surface Science · 2005 · 13 citations

Materials Engineering, Materials Science, Engineering +4

Simultaneous quantitative determination of the distribution of dopants in silicon by high mass resolution secondary ion mass spectrometry

Gerhard Stingeder, K. Piplits, S. Gara et al. · Analytical Chemistry · 1989 · 13 citations

Engineering, Biological Mass Spectrometry, Altmetric Attention Score +19