Pon Ku

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Active since

2004

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

Pon Ku is an author at IBM Research - Thomas J. Watson Research Center specializing in integrated circuit design, engineering, and electromigration reliability.

Publications per year

2004–2006

Publications

Impact of stress-induced backflow on full-chip electromigration risk assessment

H. Haznedar, M. Gall, V. Zolotov et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +17

A methodology for chip-level electromigration risk assessment and product qualification

Chanhee Oh, H. Haznedar, M. Gall et al. · 2004 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17

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