Yujuan He

Statistics

Publications

Citations

H-Index

Active since

2022

Affiliations

China Electronic Product Reliability and Environmental Test Institute(Current)

Yujuan He is an author at China Electronic Product Reliability and Environmental Test Institute specializing in photolithography, integrated circuit design, and microelectronics.

Publications per year

2022–2024

Publications

Improving Driving Current with High-Efficiency Landing Pads Technique for Reduced Parasitic Resistance in Gate-All-Around Si Nanosheet Devices

Jiajia Tian, Yujuan He, Qingzhu Zhang et al. · ECS Journal of Solid State Science and Technology · 2022 · 16 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +16

Influence of Temperature on Atmospheric Neutron-Induced SEB Failure Rate for SiC MOSFETs

Chao Peng, Zhifeng Lei, Zhangang Zhang et al. · IEEE Transactions on Nuclear Science · 2023 · 13 citations

Engineering, Electrical Engineering, Materials Engineering +17

Bias and Temperature Dependence of Radiation-Induced Degradation for SiC MOSFETs

Chao Peng, Zhifeng Lei, Zhangang Zhang et al. · IEEE Transactions on Nuclear Science · 2024 · 12 citations

Engineering, Electrical Engineering, Radiation Dosimetry +15

1–3 of 3