G.-J. Kim is an author at Samsung (South Korea) specializing in integrated circuits, electronic packaging, and system reliability.
Top concepts
EngineeringReliabilityMemory DevicesMicroelectronicsAdvanced PackagingSystem ReliabilityIntegrated CircuitsComputer EngineeringElectronic PackagingComputer Architecture
Publications per year
2021–2021
2
2
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM
Donghee Son, G.-J. Kim, J. Kim et al. · 2021 · 10 citations
Rows per page
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