Anthony B. Hmelo

Process Dependence of Proton-Induced Degradation in GaN HEMTs

Tania Roy, En Xia Zhang, Yevgeniy Puzyrev et al. · IEEE Transactions on Nuclear Science · 2010 · 106 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Profiling and Imaging Ion Mobility-Mass Spectrometry Analysis of Cholesterol and 7-Dehydrocholesterol in Cells Via Sputtered Silver MALDI

Libin Xu, Michal Kliman, Jay G. Forsythe et al. · Journal of the American Society for Mass Spectrometry · 2015 · 56 citations · Full text

Lipid Analysis, Engineering, Metal Nanoparticles +17

Semiconductor point defect concentration profiles measured using coherent acoustic phonon waves

A. Steigerwald, Ya‐Qiong Xu, J. Qi et al. · Applied Physics Letters · 2009 · 48 citations

Gaas Crystals, Engineering, Depth Range +17

Experimental characterization of a metal-oxide-semiconductor field-effect transistor-based Coulter counter

Manoj Sridhar, Dongyan Xu, Yuejun Kang et al. · Journal of Applied Physics · 2008 · 41 citations · Full text

Engineering, Analytical Microsystems, Biomedical Engineering +17

PRADA: Portable Reusable Accurate Diagnostics with nanostar Antennas for multiplexed biomarker screening

Xiaona Wen, Yu‐Chuan Ou, Holly F. Zarick et al. · Bioengineering & Translational Medicine · 2020 · 38 citations · Full text