F. Bicrel is an author at Thales (France) specializing in instrumentation, computer engineering, and radiation detection.
Top concepts
AntennaEngineeringInstrumentationSignal ProcessingRadiation DetectionComputer EngineeringFar-field MeasurementElectrical EngineeringNear-field MeasurementElectromagnetic Compatibility
Publications per year
2004–2004
1
1
Near-field techniques for detecting EMI sources
David Baudry, F. Bicrel, Lakhdar Bouchelouk et al. · 2004 · 22 citations
Engineering, Far-field Measurement, Electromagnetic Compatibility +17
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