Haebum Lee

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Active since

2014

Affiliations

Haebum Lee is an author at Samsung (South Korea) specializing in transmission electron microscopy strain mapping, materials engineering, and transmission electron microscopy.

Publications per year

2014–2014

Publications

Largely defocused probe scanning transmission electron microscopy for imaging local modulation of strain field in a hetero interface

Suhyun Kim, Yoshifumi Oshima, Younheum Jung et al. · Applied Physics Letters · 2014 · 14 citations

Engineering, Materials Engineering, Materials Science +17

Direct observation of nanometer-scale strain field around CoSi2/Si interface using scanning moiré fringe imaging

Suhyun Kim, Younheum Jung, Joong Jung Kim et al. · Applied Physics Letters · 2014 · 13 citations

Engineering, Materials Engineering, Materials Science +17

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