R. N. S. Sodhi

Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysis

R. N. S. Sodhi · The Analyst · 2004 · 319 citations

Natural Sciences, Chemistry, Materials Science +16

Interaction between Sodium Hypochlorite and Chlorhexidine Gluconate

Bettina Basrani, Sheela Manek, R. N. S. Sodhi et al. · Journal of Endodontics · 2007 · 318 citations

Natural Sciences, Chemistry, Water Treatment +6

Surface characterization of esterified cellulosic fibers by XPS and FTIR Spectroscopy

Laurent M. Matuana, John J. Balatinecz, R. N. S. Sodhi et al. · Wood Science and Technology · 2001 · 256 citations

Natural Sciences, Materials Engineering, Materials Science +13

Reference energies for inner shell electron energy-loss spectroscopy

R. N. S. Sodhi, C.E. Brion · Journal of Electron Spectroscopy and Related Phenomena · 1984 · 248 citations

Natural Sciences, Physics, Atomic Physics +9

Electrical Resistance of Ag^TS–S(CH₂)_<i>n</i>−1CH₃//Ga₂O₃/EGaIn Tunneling Junctions

Ludovico Cademartiri, Martin Thuo, Christian A. Nijhuis et al. · The Journal of Physical Chemistry C · 2012 · 233 citations · Full text

Natural Sciences, Chemistry, Materials Science +17