J. Y. Wang

Origins of stress development during metal-induced crystallization and layer exchange: Annealing amorphous Ge/crystalline Al bilayers

Z. M. Wang, J. Y. Wang, Lars P. H. Jeurgens et al. · Acta Materialia · 2008 · 80 citations

Materials Science, Aluminium Nitride, Layer Exchange +11

Tailoring the Ultrathin Al-Induced Crystallization Temperature of Amorphous Si by Application of Interface Thermodynamics

Z. M. Wang, J. Y. Wang, Lars P. H. Jeurgens et al. · Physical Review Letters · 2008 · 48 citations

The initial stage of the reaction between amorphous silicon and crystalline aluminum

D. He, J. Y. Wang, E. J. Mittemeijer · Journal of Applied Physics · 2005 · 34 citations

Aluminium Nitride, Si∕al Bilayers, Engineering +19

Evaluation of the depth resolutions of Auger electron spectroscopic, X-ray photoelectron spectroscopic and time-of-flight secondary-ion mass spectrometric sputter depth profiling techniques

J. Y. Wang, Ulrich Starke, E. J. Mittemeijer · Thin Solid Films · 2009 · 27 citations

X-ray Spectroscopy, Engineering, Physics +10

Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing

Yonghao Zhao, J. Y. Wang, E. J. Mittemeijer · Applied Physics A · 2004 · 27 citations

Materials Science, Engineering, Microstructural Changes +7