U. Serincan

Characterization of Ge nanocrystals embedded in SiO₂by Raman spectroscopy

U. Serincan, G. Kartopu, A Guennes et al. · Semiconductor Science and Technology · 2003 · 60 citations · Full text

Materials Science, Engineering, Nanomaterials +12

Formation of silicon nanocrystals in sapphire by ion implantation and the origin of visible photoluminescence

Selçuk Yerci, U. Serincan, İlker Doğan et al. · Journal of Applied Physics · 2006 · 47 citations · Full text

Optical Materials, Engineering, Silicon On Insulator +16

Structural and optical properties of porous nanocrystalline Ge

G. Kartopu, Andrei Sapelkin, V. A. Karavanskiǐ et al. · Journal of Applied Physics · 2008 · 42 citations · Full text

Porous Nanocrystalline Ge, Optical Materials, Engineering +18

Mechanisms of void formation in Ge implanted SiO2 films

E.S. Marstein, A.E. Gunnæs, U. Serincan et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 28 citations

Materials Science, Engineering, Applied Physics +4

Effect of the Passivation Layer on the Noise Characteristics of Mid-Wave-Infrared InAs/GaSb Superlattice Photodiodes

Tunay Tansel, Kutlu Kutluer, Ömer Salihoglu et al. · IEEE Photonics Technology Letters · 2012 · 28 citations · Full text

Short Wavelength Optic, Optical Materials, Engineering +18