M. Av-Ron

Impact ionization and positive charge in thin SiO2 films

M. Shatzkes, M. Av-Ron · Journal of Applied Physics · 1976 · 101 citations

Electrical Engineering, Sio2 Layer, Engineering +13

On the nature of conduction and switching in SiO2

M. Shatzkes, M. Av-Ron, Robin Anderson · Journal of Applied Physics · 1974 · 60 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Electron tunneling at Al-SiO2 interfaces

M. Av-Ron, M. Shatzkes, T. H. DiStefano et al. · Journal of Applied Physics · 1981 · 52 citations · Full text

Electrical Engineering, Engineering, Effective Barrier Height +14

Determination of breakdown rates and defect densities in SiO2

M. Shatzkes, M. Av-Ron · Thin Solid Films · 1982 · 23 citations

Applied Physics, Time-dependent Dielectric Breakdown, Defect Formation +2

Statistics of Breakdown

M. Shatzkes, M. Av-Ron · IBM Journal of Research and Development · 1981 · 17 citations

Engineering, Diagnosis, Mathematical Statistic +16