J. J. Hoagland

Characterization of Cu-CuTCNQ-M devices using scanning electron microscopy and scanning tunneling microscopy

J. J. Hoagland, X.-D. Wang, K. W. Hipps · Chemistry of Materials · 1993 · 84 citations

Natural Sciences, Materials Engineering, Materials Science +12

Infrared and Raman spectroscopic study of ultrathin copper phthalocyanine films vapor deposited on oxidized alumina

Jess Dowdy, J. J. Hoagland, K. W. Hipps · The Journal of Physical Chemistry · 1991 · 26 citations

Natural Sciences, Chemistry, Materials Science +8

Raman and infrared spectra of metal salts of α, α-dicyano-p-toluoylcyanide: non-resonant Raman scattering in tetracyano-p-quinodimethanide

Mark Harris, J. J. Hoagland, Ursula Mazur et al. · Vibrational Spectroscopy · 1995 · 14 citations

Natural Sciences, Chemistry, Physics +10

Top metal and bias effects in the tunneling spectrum of copper(II) phthalocyanine

K. W. Hipps, J. J. Hoagland · Langmuir · 1991 · 14 citations

Natural Sciences, Chemistry, Materials Science +7

Raman spectral studies of aluminum-aluminum oxide-metal phthalocyanine-metal tunnel diodes: bias and top metal dependence

J. J. Hoagland, Jess Dowdy, K. W. Hipps · The Journal of Physical Chemistry · 1991 · 11 citations

Natural Sciences, Chemistry, Materials Science +12