Çiğdem Bilkan

The source of negative capacitance and anomalous peak in the forward bias capacitance-voltage in Cr/p-si Schottky barrier diodes (SBDs)

Çiğdem Bilkan, Ahmet Gümüş, Ş. Altındal · Materials Science in Semiconductor Processing · 2015 · 91 citations

Electrical Engineering, Engineering, Electronic Engineering +5

Frequency and voltage dependence dielectric properties, ac electrical conductivity and electric modulus profiles in Al/Co 3 O 4 -PVA/p-Si structures

Çiğdem Bilkan, Yashar Azizian‐Kalandaragh, Ş. Altındal et al. · Physica B Condensed Matter · 2016 · 67 citations

Materials Engineering, Materials Science, Electrical Engineering +7

A compare of electrical characteristics in Al/p-Si (MS) and Al/C20H12/p-Si (MPS) type diodes using current–voltage (I–V) and capacitance–voltage (C–V) measurements

Çiğdem Bilkan, S. Zeyrek, Sait Eren San et al. · Materials Science in Semiconductor Processing · 2015 · 60 citations

Electrical Characteristics, Semiconductor Technology, Electrical Engineering +4

On the temperature dependent current transport mechanisms and barrier inhomogeneity in Au/SnO2–PVA/n-Si Schottky barrier diodes

Çiğdem Bilkan, S. Fotouhi-Shablou, Yashar Azizian‐Kalandaragh et al. · Applied Physics A · 2017 · 49 citations

Semiconductor Technology, Electrical Engineering, Engineering +5

Investigation of frequency and voltage dependence surface states and series resistance profiles using admittance measurements in Al/p-Si with Co 3 O 4 -PVA interlayer structures

Çiğdem Bilkan, Ş. Altındal, Yashar Azizian‐Kalandaragh · Physica B Condensed Matter · 2017 · 45 citations

Materials Science, Electrical Engineering, Engineering +10