W. Qian

Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy

J. C. H. Spence, W. Qian, Mark P. Silverman · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1994 · 79 citations

Fresnel Edge Fringes, Optical Materials, Engineering +24

Brightness measurements of nanometer-sized field-emission-electron sources

W. Qian, M. R. Scheinfein, John C. H. Spence · Journal of Applied Physics · 1993 · 63 citations

Synchrotron Radiation, Engineering, Physics +13

Aberrations of emission cathodes: Nanometer diameter field-emission electron sources

M. R. Scheinfein, W. Qian, J.C.H. Spence · Journal of Applied Physics · 1993 · 52 citations

Engineering, Electron-beam Lithography, Microscopy +16

Experimental low-voltage point-projection microscopy and its possibilities

John C. H. Spence, W. Qian, A.J. Melmed · Ultramicroscopy · 1993 · 40 citations

Microscopy Method, Microscopy, Scanning Probe Microscopy +3

Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V

John C. H. Spence, W. Qian, X. Zhang · Ultramicroscopy · 1994 · 33 citations

Engineering, Health Sciences, Electron Microscopy +13