Statistics
Publications
1
Citations
41
H-Index
1
Active since
2003
Affiliations
Philips (Netherlands)(Current)
M. van Dort is an author at Philips (Netherlands) specializing in gate leakage, leakage current reduction, and gate oxide reliability.
Publications per year
2003–2003
1
1
The effect of silicide on ESD performance
Guido Notermans, A. Heringa, M. van Dort et al. · 2003 · 41 citations
Engineering, Electrical Engineering, Electronic Materials +16
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