V. A. Krupenin

Background charge noise in metallic single-electron tunneling devices

A. B. Zorin, F. J. Ahlers, J. Niemeyer et al. · Physical review. B, Condensed matter · 1996 · 249 citations

Engineering, Electrical Engineering, Physics +17

Biosensor based on a silicon nanowire field-effect transistor functionalized by gold nanoparticles for the highly sensitive determination of prostate specific antigen

G. V. Presnova, D. Е. Presnov, V. A. Krupenin et al. · Biosensors and Bioelectronics · 2016 · 143 citations

Engineering, Bioengineering, Biomedical Engineering +17

Noise in Al single electron transistors of stacked design

V. A. Krupenin, D. Е. Presnov, M. N. Savvateev et al. · Journal of Applied Physics · 1998 · 74 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Single-electron tunneling through an individual arsenic dopant in silicon

V. V. Shorokhov, D. Е. Presnov, Sergey V. Amitonov et al. · Nanoscale · 2016 · 58 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Single-electron transistor with metallic microstrips instead of tunnel junctions

V. A. Krupenin, A. B. Zorin, M. N. Savvateev et al. · Journal of Applied Physics · 2001 · 53 citations · Full text

Engineering, Electrical Engineering, Materials Science +17