Anthony Coyette

Analog fault coverage improvement using final-test dynamic part average testing

Wim Dobbelaere, Ronny Vanhooren, Willy De Man et al. · 2016 · 24 citations

Reliability Engineering, Engineering, System Testing +12

Effective DC fault models and testing approach for open defects in analog circuits

Baris Esen, Anthony Coyette, Georges Gielen et al. · 2016 · 22 citations · Full text

Engineering, Analog Design, Open Defects +16

Design and test of analog circuits towards sub-ppm level

Georges Gielen, Wim Dobbelaere, Ronny Vanhooren et al. · 2014 · 20 citations · Full text

Electrical Engineering, Engineering, Circuit System +14

Automated testing of mixed-signal integrated circuits by topology modification

Anthony Coyette, Baris Esen, Ronny Vanhooren et al. · 2015 · 19 citations · Full text

Engineering, Analog Design, Integrated Circuits +21

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

Wim Dobbelaere, Frederik Colle, Anthony Coyette et al. · 2019 · 19 citations

Engineering, Vlsi Design, Electronic Design +19