James Chien-Mo Li

Survey of Scan Chain Diagnosis

Yu Huang, Ruifeng Guo, Wu-Tung Cheng et al. · IEEE Design & Test of Computers · 2008 · 86 citations

Engineering, Inspection, Scan-based Testing +20

A Secure Test Wrapper Design Against Internal and Boundary Scan Attacks for Embedded Cores

Geng-Ming Chiu, James Chien-Mo Li · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2010 · 71 citations

Hardware Trojan, Engineering, Information Security +21

Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs

James Chien-Mo Li, E.J. McCluskey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2005 · 52 citations

Engineering, Defect Tolerance, Defect Resistor +16

Simultaneous Optimization of Analog Circuits With Reliability and Variability for Applications on Flexible Electronics

Yen‐Lung Chen, Wan-Rong Wu, Chien‐Nan Jimmy Liu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 25 citations

Electrical Engineering, Reliability Engineering, Engineering +13

Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits

Chun-Yi Kuo, Chi-Jih Shih, Yi-Chang Lu et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2013 · 21 citations

Hardware Security, Electrical Engineering, Engineering +15