Concepedia
Statistics
Publications
2
Citations
91
H-Index
Active since
1980
J. M. Schoen is an author specializing in electromigration analysis, electromigration reliability, and device reliability.
Publications per year
1980–1980
Monte Carlo calculations of structure-induced electromigration failure
J. M. Schoen · Journal of Applied Physics · 1980 · 54 citations
Natural Sciences, Materials Engineering, Materials Science +17
A model of electromigration failure under pulsed condition
J. M. Schoen · Journal of Applied Physics · 1980 · 37 citations
Engineering, Electrical Engineering, Materials Science +14
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