X. Vanden Eynde

ToF-SIMS quantification of polystyrene spectra based on principal component analysis (PCA)†

X. Vanden Eynde, P. Bertrand · Surface and Interface Analysis · 1997 · 77 citations

Polystyrene Spectra, Engineering, Chemistry +18

Kiloelectronvolt Particle-Induced Emission and Fragmentation of Polystyrene Molecules Adsorbed on Silver:  Insights from Molecular Dynamics

Arnaud Delcorte, X. Vanden Eynde, P. Bertrand et al. · The Journal of Physical Chemistry B · 2000 · 69 citations

Engineering, Nanocluster, Metal Nanoparticles +22

Investigation into the surface selective oxidation of dual‐phase steels by XPS, SAM and SIMS

X. Vanden Eynde, J. P. Servais, M. Lamberigts · Surface and Interface Analysis · 2003 · 54 citations

Materials Science, Materials Engineering, Chemical Engineering +14

High temperature deformation of oxide scale

Lucía Suárez, Yvan Houbaert, X. Vanden Eynde et al. · Corrosion Science · 2008 · 47 citations

Materials Science, Engineering, Severe Plastic Deformation +5

Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis

X. Vanden Eynde, P. Bertrand · Applied Surface Science · 1999 · 42 citations

Materials Science, Engineering, Polymer Solution +11