X. Vanden Eynde - Concepedia

Author

X. Vanden Eynde

UCLouvain ORCID

Also Known As

X Vanden Eynde, X. Vanden Eynde, Xavier Vanden Eynde

Publications

753

Citations

H-Index

Concepts

All Affiliations

UCLouvain University of Liège CRM Group (Belgium)Fundació CTM Centre Tecnològic Universidad Autónoma de Nuevo León

About

X. Vanden Eynde is an author at UCLouvain specializing in engineering, materials science, and chemistry.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	23	688
2	Medicine	2	2	97
3	Applied Physics	2	2	69
4	Biochemistry	2	2	111
5	Natural Sciences	1	1	34

X. Vanden Eynde

Publications

707

Citations

H-Index

Page 1

	Year	Citations
ToF-SIMS quantification of polystyrene spectra based on principal component analysis (PCA)† X. Vanden Eynde, P. Bertrand Surface and Interface Analysis Polystyrene SpectraEngineeringChemistryPolymersTof-sims Quantification	1997	77
Kiloelectronvolt Particle-Induced Emission and Fragmentation of Polystyrene Molecules Adsorbed on Silver: Insights from Molecular Dynamics Arnaud Delcorte, X. Vanden Eynde, P. Bertrand, The Journal of Physical Chemistry B EngineeringNanoclusterMetal NanoparticlesChemistryMolecular Dynamics	2000	69
Investigation into the surface selective oxidation of dual‐phase steels by XPS, SAM and SIMS X. Vanden Eynde, J. P. Servais, M. Lamberigts Surface and Interface Analysis Materials ScienceMaterials EngineeringChemical EngineeringSimulation AnnealingSio 2	2003	54
High temperature deformation of oxide scale Lucía Suárez, Yvan Houbaert, X. Vanden Eynde, Corrosion Science Materials ScienceEngineeringSevere Plastic DeformationHigh Temperature DeformationApplied Physics	2008	47
Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis X. Vanden Eynde, P. Bertrand Applied Surface Science Materials ScienceEngineeringPolymer SolutionPolymer ScienceMechanical Engineering	1999	42
Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectra X. Vanden Eynde, P. Bertrand, R. Jérôme Macromolecules EngineeringBiological Mass SpectrometryOrganic ChemistryIon Mobility SpectrometryChemistry	1997	34
Thermochemical surface treatment of iron–silicon and iron–manganese alloys X. Vanden Eynde, J. P. Servais, M. Lamberigts Surface and Interface Analysis Materials EngineeringMaterials ScienceChemical EngineeringEngineeringCrystalline Defects	2002	34
Influence of Tacticity on Polymer Surfaces Studiedby ToF-SIMS X. Vanden Eynde, Lu‐Tao Weng, P. Bertrand Surface and Interface Analysis Macromolecular ChemistryEngineeringChemistrySoft MatterPolymers	1997	32
Characterization of additives at polymer surfaces by ToF‐SIMS Nicolas Médard, Claude Poleunis, X. Vanden Eynde, Surface and Interface Analysis EngineeringChemistryPolymersChemical EngineeringPolymer Technology	2002	32
Influence of the primary ion beam parameters (nature, energy, and angle) on the kinetic energy distribution of molecular fragments sputtered from poly(ethylene terephthalate) by kiloelectron volt ions Arnaud Delcorte, X. Vanden Eynde, P. Bertrand, International Journal of Mass Spectrometry Materials ScienceEngineeringPolymer SolutionPolymer ScienceKinetic Energy Distribution	1999	30

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