Hao-Long Chen

Characterization of sputtered NiO thin films

Hao-Long Chen, Yang‐Ming Lu, Weng‐Sing Hwang · Surface and Coatings Technology · 2005 · 282 citations

Materials Science, Engineering, Oxide Electronics +5

Influence of Interfacial Structure Development on the Fracture Mechanism and Bond Strength of Aluminum/Copper Bimetal Plate

Chih‐Yuan Chen, Hao-Long Chen, Weng‐Sing Hwang · MATERIALS TRANSACTIONS · 2006 · 153 citations · Full text

Interfacial Structure Development, Engineering, Mechanical Engineering +16

Effect of crystallographic orientations on electrical properties of sputter-deposited nickel oxide thin films

Hao-Long Chen, Yao-Sheng Yang · Thin Solid Films · 2007 · 118 citations

Materials Science, Material Analysis, Engineering +9

Effect of Film Thickness on Structural and Electrical Properties of Sputter-Deposited Nickel Oxide Films

Hao-Long Chen, Yang‐Ming Lu, Weng‐Sing Hwang · MATERIALS TRANSACTIONS · 2005 · 105 citations · Full text

Engineering, Fault Probabilities, Thin Film Process Technology +16

Thickness dependence of electrical and optical properties of sputtered nickel oxide films

Hao-Long Chen, Yang‐Ming Lu, Weng‐Sing Hwang · Thin Solid Films · 2005 · 76 citations

Materials Science, Optical Materials, Thickness Dependence +10