Statistics
Publications
2
Citations
33
H-Index
2
Active since
2021
Ruisen Zou is an author at University of Electronic Science and Technology of China specializing in materials science, van der waals heterostructures, and thin-film materials.
Publications per year
2021–2021
2
2
Gate-bias instability of few-layer WSe<sub>2</sub> field effect transistors
Shaofeng Wen, Changyong Lan, Chun Li et al. · RSC Advances · 2021 · 18 citations · Full text
1–2 of 2