Masatoshi Yasutake

Modification of Silicon Surface Using Atomic Force Microscope with Conducting Probe

Masatoshi Yasutake, Yasunori Ejiri, Takeo Hattori · Japanese Journal of Applied Physics · 1993 · 71 citations

Materials Science, Electrical Engineering, Engineering +15

Fabrication of nanometer-scale structures using atomic force microscope with conducting probe

Takeo Hattori, Yasunori Ejiri, Kenji Saito et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1994 · 63 citations

Engineering, Microscopy, Vacuum Device +22

A magnetic force microscope using CoFe-coated carbon nanotube probes

Hiromi Kuramochi, Takuya Uzumaki, Masatoshi Yasutake et al. · Nanotechnology · 2004 · 63 citations

Engineering, Cnt Probes, Microscopy +23

Surface potential measurements using the Kelvin probe force microscope

Masatoshi Yasutake, Daisuke Aoki, Masamichi Fujihira · Thin Solid Films · 1996 · 54 citations

Surface Potential Measurements, Engineering, Physics +7

Scanning Surface Potential Microscopy for Local Surface Analysis

Masamichi Fujihira, Hirosuke Kawate, Masatoshi Yasutake · Chemistry Letters · 1992 · 47 citations

Surface Potentials, Engineering, Microscopy +17