M. Barchuk

The Poisson Ratio in CoFe₂O₄ Spinel Thin Films

Michael Foerster, M. N. Iliev, N. Dix et al. · Advanced Functional Materials · 2012 · 87 citations

Materials Science, Material Analysis, Engineering +11

Optical properties of epitaxial BiFeO3 thin films grown on LaAlO3

Cameliu Himcinschi, Akash Bhatnagar, Andreas Talkenberger et al. · Applied Physics Letters · 2015 · 51 citations

Materials Science, Dielectric Function, Multiferroics +12

X-ray diffuse scattering from threading dislocations in epitaxial GaN layers

M. Barchuk, V. Holý, Bojan Miljević et al. · Journal of Applied Physics · 2010 · 41 citations

Materials Science, Materials Engineering, Dislocation Densities +14

Correlation between the residual stress and the density of threading dislocations in GaN layers grown by hydride vapor phase epitaxy

M. Barchuk, Christian Röder, Y. Shashev et al. · Journal of Crystal Growth · 2013 · 24 citations

Materials Science, Materials Engineering, Engineering +8

High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure

Sergey Lazarev, Sondes Bauer, Kamran Forghani et al. · Journal of Crystal Growth · 2012 · 23 citations

Materials Science, High Resolution, Engineering +8