L. A. Freeman

Dynamic observation of defect annealing in CdTe at lattice resolution

Rodney Sinclair, F. A. Ponce, Tatsuya Yamashita et al. · Nature · 1982 · 49 citations

Materials Science, Ii-vi Semiconductor, Engineering +8

Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

David J. Smith, R. A. Camps, V. E. Cosslett et al. · Ultramicroscopy · 1982 · 49 citations

Engineering, Electron Microscopy, Physics +7

Bright field and hollow cone dark field electron microscopy of palladium catalysts

L. A. Freeman, A. Howie, M.M.J. Treacy · Journal of Microscopy · 1977 · 39 citations

Short Wavelength Optic, Optical Materials, Dark Field +16

An electron microscope study of the diffusion of metals in amorphous arsenic triselenide films

L. A. Freeman, R. F. Shaw, A. D. Yoffe · Thin Solid Films · 1969 · 33 citations

Materials Science, Engineering, Electron Microscope Study +8

Recent improvements to the Cambridge University 600 kV High Resolution Electron Microscope

David J. Smith, R. A. Camps, L. A. Freeman et al. · Journal of Microscopy · 1983 · 30 citations

Engineering, Electron Microscopy, Physics +14