M. Grasserbauer

Fundamentals of surface and thin film analysis

L. C. Feldman, James W. Mayer, M. Grasserbauer · Analytica Chimica Acta · 1987 · 583 citations

Materials Science, Surface Characterization, Engineering +5

Development of crystallinity and morphology in hafnium dioxide thin films grown by atomic layer epitaxy

Mikko Ritala, Markku Leskelä, Lauri Niinistö et al. · Thin Solid Films · 1994 · 201 citations

Materials Science, Engineering, Atomic Layer Epitaxy +8

Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces

Ingo Schmitz, Manfred Schreiner, Gernot Friedbacher et al. · Applied Surface Science · 1997 · 154 citations

Materials Science, Humidity-sensitive Surfaces, Engineering +14

Wavelet denoising of Gaussian peaks: A comparative study

Christian Mittermayr, S.G. Nikolov, Herbert Hutter et al. · Chemometrics and Intelligent Laboratory Systems · 1996 · 107 citations

Wavelet Denoising, Engineering, Biomedical Imaging +4

Comparison of different sorbent materials for on-line solid-phase extraction with liquid chromatography–atmospheric pressure chemical ionization mass spectrometry of phenols

René Wissiack, Erwin Rosenberg, M. Grasserbauer · Journal of Chromatography A · 2000 · 100 citations

Solvent Extraction, Chemical Engineering, Engineering +10