Johannes Hoffmann

Statistics

Publications

Citations

140

H-Index

Active since

2007

Affiliations

Swiss Federal Institute of Metrology(Current)

ETH Zurich

Keysight Technologies (Austria)

Agilent Technologies (Austria)

Johannes Kepler University of Linz

Johannes Hoffmann is an author at Swiss Federal Institute of Metrology specializing in electrical engineering, engineering, and microwave measurements.

ORCID

Publications per year

2007–2022

Publications

A calibration algorithm for nearfield scanning microwave microscopes

Johannes Hoffmann, Michael Wollensack, M. Zeier et al. · 2012 · 37 citations

Engineering, Electrical Engineering, Computational Electromagnetics +11

Measuring low loss dielectric substrates with scanning probe microscopes

Johannes Hoffmann, Georg Gramse, Jens Niegemann et al. · Applied Physics Letters · 2014 · 36 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Measurement Uncertainty in Battery Electrochemical Impedance Spectroscopy

Amin Moradpour, Manuel Kasper, Johannes Hoffmann et al. · IEEE Transactions on Instrumentation and Measurement · 2022 · 34 citations · Full text

Engineering, Electrical Engineering, Electrochemical Engineering +16

Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

Manuel Kasper, Georg Gramse, Johannes Hoffmann et al. · Journal of Applied Physics · 2014 · 18 citations

Engineering, Electrical Engineering, Materials Science +17

Computing uncertainties of S-parameters by means of Monte Carlo Simulation

Johannes Hoffmann, P. Leuchtmann, Juerg Schaub et al. · 2007 · 15 citations

Engineering, Computational Engineering, Metrology +16

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