Slawomir Pilarski

Circular self-test path: a low-cost BIST technique for VLSI circuits

Andrzej Kraśniewski, Slawomir Pilarski · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989 · 152 citations

Engineering, Computer Engineering, Electrical Engineering +15

Circular self-test path: a low-cost BIST technique

Andrzej Kraśniewski, Slawomir Pilarski · 1987 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +13

Estimating testing effectiveness of the circular self-test path technique

Slawomir Pilarski, Andrzej Kraśniewski, Tsunehiko Kameda · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992 · 38 citations

Engineering, Computer Engineering, Electrical Engineering +13

BIST and delay fault detection

Slawomir Pilarski, A. Pierzynska · 2002 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +13

Non-robust versus robust [test generation]

A. Pierzynska, Slawomir Pilarski · 2002 · 28 citations

Engineering, Computer Engineering, Computer Science +13