David J. Surman

Fast atom bombardment quadrupole mass spectrometry

David J. Surman, John C. Vickerman · Journal of the Chemical Society Chemical Communications · 1981 · 139 citations

Natural Sciences, Chemistry, Analytical Chemistry +7

Differential Charging in XPS. Part II: Sample Mounting and X-ray Flux Effects on Heterogeneous Samples

Brian J. Tielsch, Julia E. Fulghum, David J. Surman · Surface and Interface Analysis · 1996 · 43 citations

Natural Sciences, Materials Engineering, Materials Science +14

Plasma-polymerized coatings of trimethylsilane deposited on cold-rolled steel substrates Part 2. Effect of deposition conditions on corrosion performance

W.J. van Ooij, David J. Surman, H. Yasuda · Progress in Organic Coatings · 1995 · 35 citations

Natural Sciences, Materials Engineering, Materials Science +17

Fast atom bombardment mass spectrometry for applied surface analysis

David J. Surman, Jaap van den Berg, J. C. Vickerman · Surface and Interface Analysis · 1982 · 29 citations

Natural Sciences, Chemistry, Materials Science +16

Axis: An imaging x‐ray photoelectron spectrometer

I. W. Drummond, F.J. Street, L. P. Ogden et al. · Scanning · 1991 · 21 citations

Natural Sciences, Chemistry, Analytical Chemistry +9