Adam L. Pintar

Statistics

Publications

Citations

317

H-Index

Active since

2011

Affiliations

National Institute of Standards and Technology(Current)

Information Technology Laboratory

Material Measurement Laboratory

Adam L. Pintar is an author at National Institute of Standards and Technology specializing in engineering, materials engineering, and x-ray computed tomography.

ORCID

Publications per year

2011–2022

Publications

Development of two fine particulate matter standard reference materials (<4 μm and <10 μm) for the determination of organic and inorganic constituents

Michele M. Schantz, Danielle Cleveland, N. Alan Heckert et al. · Analytical and Bioanalytical Chemistry · 2016 · 48 citations

Natural Sciences, Chemistry, Environmental Sciences +12

The Influence of X-Ray Computed Tomography Acquisition Parameters on Image Quality and Probability of Detection of Additive Manufacturing Defects

Felix H. Kim, Adam L. Pintar, Shawn P. Moylan et al. · Journal of Manufacturing Science and Engineering · 2019 · 41 citations · Full text

Engineering, Industrial Engineering, Manufacturing Engineering +17

Merging experiments and computer simulations in X-ray Computed Tomography probability of detection analysis of additive manufacturing flaws

Felix H. Kim, Adam L. Pintar, Anne-Françoise Obaton et al. · NDT & E International · 2021 · 34 citations

Engineering, Computational Engineering, Manufacturing Engineering +13

Improved calculation method for insulation-based fire resistance of composite slabs

Jian Jiang, Adam L. Pintar, Jonathan M. Weigand et al. · Fire Safety Journal · 2019 · 23 citations · Full text

Engineering, Civil Engineering, Materials Engineering +16

Milk and serum standard reference materials for monitoring organic contaminants in human samples

Michele M. Schantz, Gauthier Eppe, Jean-François Focant et al. · Analytical and Bioanalytical Chemistry · 2012 · 22 citations · Full text

Agriculture, Toxicology, Analytical Chemistry +11

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