Jianlong Kang

Review of Methodologies for Evaluating Short-Circuit Robustness and Reliability of SiC Power MOSFETs

Ruijie Cui, Zhen Xin, Qing Liu et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 2021 · 35 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition

Jianlong Kang, Qing Liu, Haoze Luo et al. · IEEE Transactions on Industrial Electronics · 2022 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

An Online Gate Oxide Degradation Monitoring Method for SiC MOSFETs With Contactless PCB Rogowski Coil Approach

Jianlong Kang, Ankang Zhu, Yu Chen et al. · IEEE Transactions on Power Electronics · 2023 · 24 citations

Engineering, Electrical Engineering, Electronic Materials +16

A Highly Precise On-State Voltage Measurement Circuit With Dual Current Sources for Online Operation of SiC MOSFETs

Hui Meng, Letian Xiang, Luwei Zuo et al. · IEEE Open Journal of Power Electronics · 2023 · 12 citations · Full text

Engineering, Electrical Engineering, Microelectronics +13