Improvement of beam uniformity by magnetic filter optimization in a Cs-seeded large negative-ion source

M. Hanada, T. Seki, N. Takado, +9

Review of Scientific Instruments

Plasma UniformityEngineeringPlasma SciencePlasma PhysicsIon Beam Instrumentation +18

The origin of beam non-uniformity in a large Cs-seeded negative ion source

M. Hanada, T. Seki, N. Takado, +7

Nuclear Fusion

Ion ImplantationEngineeringBeam Non-uniformityPhysicsLongitudinal Beam Non-uniformity +9

Numerical analysis of the production profile of H atoms and subsequent H− ions in large negative ion sources

N. Takado, H. Tobari, Takashi Inoue, +5

Journal of Applied Physics

Numerical AnalysisEngineeringPhysicsH0 AtomsProduction Profile +11

Uniform H− ion beam extraction in a large negative ion source with a tent-shaped magnetic filter

H. Tobari, M. Hanada, M. Kashiwagi, +6

Review of Scientific Instruments

Tent-shaped Magnetic FilterElectrical EngineeringEngineeringPhysicsNegative Ion Beam +11

Analysis of electron energy distribution of an arc-discharge H− ion source with Monte Carlo simulation

I. Fujino, A. Hatayama, N. Takado, +1

Review of Scientific Instruments

Numerical analysis of the spatial nonuniformity in a Cs-seeded H− ion source

N. Takado, J. Hanatani, T. Mizuno, +5

Review of Scientific Instruments

Numerical AnalysisH− Ion ProductionH− IonEngineeringIon Implantation +12

Numerical analysis of primary electrons in a tandem-type negative ion source

K. Katoh, N. Takado, A. Hatayama, +3

Review of Scientific Instruments

Numerical AnalysisEngineeringMagnetic DriftPlasma PhysicsSpatial Nonuniformity +14

Negative Ion Production in High Electron Temperature Plasmas

H. Tobari, Takayoshi Seki, N. Takado, +5

Plasma and Fusion Research

Cesium Seeded ConditionEngineeringPhysicsLow-temperature PlasmasSurface Science +9

Experimental study on spatial uniformity of H− ion beam in a large negative ion source

M. Hanada, T. Seki, N. Takado, +9

Fusion Engineering and Design

H− Ion BeamPhysicsApplied PhysicsExperimental StudyIon Beam Instrumentation +3