Camiel Heffels

New developments in particle characterization by laser diffraction: size and shape

Zhenhua Ma, Henk G. Merkus, Jan G. A. E. de Smet et al. · Powder Technology · 2000 · 189 citations

Natural Sciences, Materials Science, Physics +14

Correction of the Effect of Particle Shape on the size distribution measured with a laser diffraction instrument

Camiel Heffels, Peter J.T. Verheijen, Daniel Heitzmann et al. · Particle & Particle Systems Characterization · 1996 · 27 citations · Full text

Natural Sciences, Materials Science, Physics +17

Control of Particulate Processes by Optical Measurement Techniques

Camiel Heffels, Reinhard Polke, Matthias Rädle et al. · Particle & Particle Systems Characterization · 1998 · 23 citations

Engineering, Chemical Engineering, Industrial Engineering +15

Forward light scattering for arbitrary sharp-edged convex crystals in Fraunhofer and anomalous diffraction approximations

Camiel Heffels, Daniel Heitzmann, E. Dan Hirleman et al. · Applied Optics · 1995 · 20 citations

Natural Sciences, Physics, Crystal Structure +16

Possibilities of near backward light scattering for characterizing dense particle systems

Camiel Heffels, A.W. Willemse, B. Florence Scarlett · Powder Technology · 1996 · 19 citations

Natural Sciences, Physics, Condensed Matter Physics +12