Eduardo Luiz Augusto Macchione

Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

Lucas Antunes Tambara, Fernanda Lima Kastensmidt, N. H. Medina et al. · 2015 · 51 citations

Engineering, Aerospace Engineering, Computer Engineering +15

Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

Ádria Barros de Oliveira, Gennaro S. Rodrigues, Fernanda Lima Kastensmidt et al. · IEEE Transactions on Nuclear Science · 2018 · 51 citations · Full text

Engineering, Computer Engineering, Computer Science +17

Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects

Juliano Benfica, Bruno Green, Bruno C. Porcher et al. · IEEE Transactions on Nuclear Science · 2016 · 46 citations · Full text

Engineering, Computer Engineering, Radiation Measurement +6

Experimental setup for Single Event Effects at the São Paulo 8UD Pelletron Accelerator

Vitor A. P. Aguiar, N. Added, N. H. Medina et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2014 · 42 citations

Natural Sciences, Nuclear Engineering, Physics +17

Mechanism of soybean (Glycine max L. Merrill) degreening related to maturity stage and postharvest drying temperature

Patrícia Sinnecker, Nelson Raimundo Braga, Eduardo Luiz Augusto Macchione et al. · Postharvest Biology and Technology · 2005 · 34 citations

Agriculture, Agronomy, Plant Sciences +10