V.A. Meier

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

Andreas Schropp, Robert Hoppe, V.A. Meier et al. · Scientific Reports · 2013 · 152 citations · Full text

Natural Sciences, Materials Science, Physics +14

Imaging Shock Waves in Diamond with Both High Temporal and Spatial Resolution at an XFEL

Andreas Schropp, Robert Hoppe, V.A. Meier et al. · Scientific Reports · 2015 · 130 citations · Full text

Natural Sciences, Materials Science, Physics +15

X-Ray Videomicroscopy Studies of Eutectic Al-Si Solidification in Al-Si-Cu

Ragnvald H. Mathiesen, L. Arnberg, Y. Li et al. · Metallurgical and Materials Transactions A · 2010 · 45 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

Daniel Nilsson, Fredrik Uhlén, Anders Holmberg et al. · Optics Letters · 2012 · 21 citations

Natural Sciences, Physics, Optics +15

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser

Fredrik Uhlén, Daniel Nilsson, Anders Holmberg et al. · Optics Express · 2013 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17