Scott Vander Wiel - Concepedia

Author

Scott Vander Wiel

Also Known As

Athanasios Stamatopoulos, Murph, Alexander C., Noah Walton, S. A. Vander Wiel, S. Vander Wiel, S. VanderWiel, S.A. Vander Wiel, S.V. Wiel, S. A. Vander Wiel, Scott A. Vander Wiel

106

Publications

2.2K

Citations

H-Index

108

Concepts

All Affiliations

Los Alamos National Laboratory AT&T (United States)Iowa State University University of California, Berkeley GE Global Research (United States)

About

Scott Vander Wiel is an author at Los Alamos National Laboratory specializing in engineering, computer science, and systems engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	22	1.7K
2	Management	3	3	207
3	Business	1	1	21
4	Medicine	1	1	64
5	Natural Sciences	1	1	17

Scott Vander Wiel

Publications

Citations

H-Index

Page 1

	Year	Citations
Modeling of additive manufacturing processes for metals: Challenges and opportunities Marianne Francois, Ailing Sun, Wayne E. King, Current Opinion in Solid State and Materials Science Materials ScienceEngineeringDirected Energy DepositionAdvanced ManufacturingComputer-aided Design	2017	444
Time-Varying Network Tomography: Router Link Data Jin Cao, Drew Davis, Scott Vander Wiel, Journal of the American Statistical Association Internet Traffic AnalysisEngineeringMaximum Likelihood EstimationNetwork AnalysisTime-varying Network Tomography	2000	290
Algorithmic Statistical Process Control: Concepts and an Application Scott Vander Wiel, William T. Tucker, Frederick W. Faltin, Technometrics	1992	193
Estimating software fault content before coding Stephen G. Eick, Mei Long, Lawrence G. Votta, Software MaintenanceSoftware Reliability TestingEngineeringSoftware EngineeringSource Code Analysis	1992	148
Time-Varying Network Tomography: Router Link Data Jin Cao, Drew Davis, Scott Vander Wiel, Journal of the American Statistical Association Internet Traffic AnalysisEngineeringMaximum Likelihood EstimationNetwork AnalysisTime-varying Network Tomography	2000	131
Monitoring Processes That Wander Using Integrated Moving Average Models Scott Vander Wiel Technometrics Forecasting MethodologyEngineeringRandom SampleControl ChartVolume Prediction	1996	122
Algorithmic Statistical Process Control: An Elaboration William T. Tucker, Frederick W. Faltin, Scott Vander Wiel Technometrics Uniting Traditional SpcControl StrategyStatistical Process ControlEngineeringControl Method	1993	90
Assessing software designs using capture-recapture methods Scott Vander Wiel, Lawrence G. Votta IEEE Transactions on Software Engineering Software MaintenanceEngineeringSoftware EngineeringSoftware AnalysisCapture-recapture Methods	1993	85
Monitoring Processes That Wander Using Integrated Moving Average Models Scott Vander Wiel Technometrics Forecasting MethodologyProcess DataEngineeringRandom SampleControl Chart	1996	72
Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests Scott Vander Wiel, William Q. Meeker IEEE Transactions on Reliability ReliabilityEngineeringLife PredictionLongevityEstimation Statistic	1990	64

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