Ute Geisler

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Active since

2010

Affiliations

Fraunhofer Institute for Reliability and Microintegration(Current)

Ute Geisler is an author at Fraunhofer Institute for Reliability and Microintegration specializing in semiconductor reliability, material degradation, and reliability degradation mechanisms.

Publications per year

2010–2010

Publications

Interface degradation of Al heavy wire bonds on power semiconductors during active power cycling measured by the shear test

Jens Goehre, Martin Schneider‐Ramelow, Ute Geisler et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 2010 · 39 citations

Engineering, Materials Engineering, Materials Science +15

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