M. Kovler

Si O 2 ∕ Si 3 N 4 ∕ Al 2 O 3 stacks for scaled-down memory devices: Effects of interfaces and thermal annealing

M. Lisiansky, A. Heiman, M. Kovler et al. · Applied Physics Letters · 2006 · 35 citations

N 4, Non-volatile Memory, Engineering +18

Structure, Chemistry, and Electrical Performance of Silicon Oxide-Nitride-Oxide Stacks on Silicon

Igor Levin, M. Kovler, Yakov Roizin et al. · Journal of The Electrochemical Society · 2004 · 14 citations

Materials Science, Electrical Engineering, Engineering +14

Modeling of aluminum via filling by forcefill

Y. Estrin, Hyoung Seop Kim, M. Kovler et al. · Journal of Applied Physics · 2003 · 13 citations

Materials Science, Simple Constitutive Model, Engineering +15

Radiation-induced nitrogen segregation during electron energy loss spectroscopy of silicon oxide–nitride-oxide stacks

Igor Levin, Richard D. Leapman, M. Kovler et al. · Applied Physics Letters · 2003 · 11 citations · Full text

Engineering, Nitrogen Diffusion, Silicon On Insulator +18

Perspective on Si Negative Potential Dissolution Mechanism

David Starosvetsky, M. Kovler, Yair Ein‐Eli · Electrochemical and Solid-State Letters · 2004 · 10 citations

Materials Science, Chemical Engineering, Engineering +9